Manual Prober
(for 12-inch wafer)
Features
Model 705A-WG7
Manual Prober for 12-inch wafer
Manual prober for analyses of wafers up to 12 inches
Easy operation
-
01Air bearing stage for easy one-handed operation
Allows stage positioning within a short time, which improves measurement efficiency.
Wide contact area
-
01Slide table for securing wide probing area
Eliminates the need to reposition the device under measurement, which improves evaluation efficiency.
Safety design
-
01Safety lock mechanism to prevent damage to devices and probes caused by improper contact operation
Reduces wasteful remaking of devices, remeasurement, and probe maintenance.
Customizable
- Customizable according to the intended use, for example, with addition of microscope or laser cutter
Specifications: Manual Prober Model 705A-WG7(for 12-inch wafer)
| Maximum wafer size | φ300mm |
|---|---|
| Stage travel (rough adjustment) |
X: 500mm Y: 400mm |
| Sub-stage travel (fine adjustment) |
X: 25mm Y: 25mm |
| Z stroke | 0 / 0.3 / 3.5mm+37.5mm |
| Θ travel | Rough adjustment: ±45° Fine adjustment: ±5° |
| External dimensions (WxDxH) |
978mm×1,038mm×748mm (excluding options) |
| System weight | 130kg (excluding options) |
List of Wafer Prober Products
-
Semi-Automatic Prober
(for 8-inch wafer Low Current Measurement) -
Manual Prober
(for 8-inch wafer Low Current Measurement) -
Manual Prober
(for 6-inch wafer/8-inch wafer) -
Manual Prober
(for 12-inch wafer) -
Personal Manual Prober
(for 2-inch wafer/4-inch wafer)
