{"id":1826,"date":"2023-04-03T21:17:16","date_gmt":"2023-04-03T12:17:16","guid":{"rendered":"http:\/\/adop-mjc-test.com\/?page_id=1624"},"modified":"2026-03-26T12:44:50","modified_gmt":"2026-03-26T03:44:50","slug":"tester","status":"publish","type":"page","link":"https:\/\/adop-mjc-test.com\/en\/products_service\/tester\/","title":{"rendered":"Semiconductor Test Equipment (IC Tester)"},"content":{"rendered":"    <section>\r\n      <div class=\"inner title--has-image\">\r\n        <h1 class=\"inner\">Semiconductor Test Equipment <span>(IC Tester)<\/span><\/h1>\r\n\r\n        <ul class=\"breadcrumbs\">\r\n          <li><a href=\"\/en\/\">Top<\/a><\/li>\r\n          <li><a href=\"\/en\/products_service\/\">Products\u30fbService<\/a><\/li>\r\n          <li>Semiconductor Test Equipment (IC Tester)<\/li>\r\n        <\/ul>\r\n      <\/div>\r\n\r\n      <div class=\"title-image\">\r\n        <img decoding=\"async\" src=\"https:\/\/adop-mjc-test.com\/wp-content\/themes\/adop-mjc\/img\/products\/title_tester_pc.jpg?v=251113\" alt=\"\" class=\"switch\">\r\n      <\/div>\r\n\r\n      <div class=\"lead--brown-paragraph\">\r\n        <h2 class=\"lead--brown-title\"><span class=\"show lazy\">Testalio<\/span><\/h2>\r\n        <div class=\"lead--brown-text show lazy\">\r\n          <p>Equipment to determine the pass\/fail of devices in the wafer inspection process and the final inspection process after packaging.<br>Testalio means \u201cTester+All in one\u201d. Testalio optimizes customer test environments across 4 different platform types.<\/p>\r\n        <\/div>\r\n      <\/div>\r\n\r\n      <section>\r\n        <div class=\"inner\">\r\n          <ul class=\"anchor-link--another pdg-b170 flex flex_fw flex_jc show lazy\">\r\n            <li><a href=\"#Tester\"><span>What is Semiconductor Test Equipment <span>(IC Tester)?<\/span><\/span><\/a><\/li>\r\n            <li><a href=\"#BistDft\"><span>What is a DFT?<\/span><\/a><\/li>\r\n          <\/ul>\r\n        <\/div>\r\n\r\n        <div class=\"pdg-tb170 bg-gray\">\r\n          <div class=\"inner\">\r\n            <h2 class=\"tester__catch pdg-b70 show lazy\">We will develop custom testers and test systems with selected functions to suit the test environment or budget.<\/h2>\r\n            <ul class=\"product-detail__features flex_pc flex_fw flex_jsb\">\r\n              <li class=\"show lazy\">\r\n                <p><span class=\"poppins\">01<\/span>New test modules can be provided on demand to test a wide range of devices<\/p>\r\n              <\/li>\r\n              <li class=\"show lazy\">\r\n                <p><span class=\"poppins\">02<\/span>Building test solutions for various type of devices or by adding software to meet needs<\/p>\r\n              <\/li>\r\n              <li class=\"show lazy\">\r\n                <p><span class=\"poppins\">03<\/span>The main body can be selected from 4 types depending on the test modules configuration<\/p>\r\n              <\/li>\r\n              <li class=\"show lazy\">\r\n                <p><span class=\"poppins\">04<\/span>Space-saving with built-in power supply and PC control in the housing platform<\/p>\r\n              <\/li>\r\n            <\/ul>\r\n          <\/div>\r\n        <\/div>\r\n\r\n        <div class=\"pdg-tb170\">\r\n          <div class=\"inner\">\r\n            <h2 class=\"tester__catch pdg-b40 show lazy\">MJC features 4 types of platform and application modules and provides a wide range of application modules according to the required number of channels.<\/h2>\r\n            <div class=\"pdg-b40\">\r\n              <img decoding=\"async\" src=\"https:\/\/adop-mjc-test.com\/wp-content\/themes\/adop-mjc\/img\/products\/tester_sample_pc.jpg?v=260116\" alt=\"Full, Half, Quarter\" class=\"switch show lazy\">\r\n            <\/div>\r\n            <p class=\"tester__catch font--bold pdg-b70 show lazy\">\r\n              Recommended models<br>\r\n              \u30fbFor design verification and failure analysis: CT-025 \/ CT-050<br>\r\n              \u30fbFor mass production: CT-050 \/ CT-100 \/ CT-200\r\n            <\/p>\r\n            <figure>\r\n              <img decoding=\"async\" src=\"https:\/\/adop-mjc-test.com\/wp-content\/themes\/adop-mjc\/img\/products\/tester_graph_en_pc.png?v=260305-2\" alt=\"\" class=\"switch show lazy\">\r\n            <\/figure>\r\n          <\/div>\r\n        <\/div>\r\n\r\n        <div class=\"pdg-t170 bg-gray\" id=\"Tester\">\r\n          <div class=\"inner show lazy\">\r\n            <h2 class=\"title--bg-brown title-accordion open\">What is Semiconductor Test Equipment (IC Tester)?<\/h2>\r\n            <div class=\"pdg-t40\">\r\n              <p class=\"font20--text font-sp14\">Semiconductor test equipment (IC tester), or automated test equipment (ATE), is a system for giving electrical signals to a semiconductor device to compare output signals against expected values for the purpose of testing if the device works as specified in its design specifications.<\/p>\r\n              <p class=\"mgn-t2em pdg-b70 font20--text font-sp14\">Testers are roughly categorized into logic testers, memory testers, and analog testers. Normally, IC testing is conducted at two levels: the wafer test (also called die sort or probe test) that tests wafers, and the package test (also called final test) after packaging. Wafer testing uses a prober and a probe card, while package testing uses a handler and a test socket, together with a tester.<\/p>\r\n\r\n              <div class=\"product-image-wrapper pdg-all60 bg-white flex_pc flex_jsb\">\r\n                <p class=\"tester__image1\">\r\n                  \u3010Logic testers\u3011\r\n                  <img decoding=\"async\" src=\"https:\/\/adop-mjc-test.com\/wp-content\/themes\/adop-mjc\/img\/products\/logic_tester_explanation.jpg?v=240412\" alt=\"\">\r\n                <\/p>\r\n\r\n                <p class=\"tester__image2\">\r\n                  \u3010Wafer Test System\u3011\r\n                  <img decoding=\"async\" src=\"https:\/\/adop-mjc-test.com\/wp-content\/themes\/adop-mjc\/img\/products\/wafer_explanation_en_pc.jpg?v=230413\" alt=\"\" class=\"switch\">\r\n                <\/p>\r\n              <\/div>\r\n            <\/div>\r\n          <\/div>\r\n        <\/div>\r\n\r\n        <div class=\"pdg-tb170 bg-gray\" id=\"BistDft\">\r\n          <div class=\"inner show lazy\">\r\n            <h2 class=\"title--bg-brown title-accordion open\">What is a DFT?<\/h2>\r\n            <div class=\"pdg-t40\">\r\n              <p class=\"pdg-b70 font20--text font-sp14\">From the initial phase of IC design, we take ease of test into consideration when the circuit structure and is built-in.<br>We can accurately test in a short time and expect to reduce test cost.<\/p>\r\n\r\n              <div class=\"pdg-b70\">\r\n                <div class=\"product-image-wrapper2 pdg-all60 bg-white flex_pc flex_jsb\">\r\n                  <p class=\"tester__image4\">\r\n                    <img decoding=\"async\" src=\"https:\/\/adop-mjc-test.com\/wp-content\/themes\/adop-mjc\/img\/products\/bist_dft_explanation2_en_pc.jpg\" alt=\"\" class=\"switch\">\r\n                  <\/p>\r\n                <\/div>\r\n              <\/div>\r\n\r\n              <h3 class=\"title--border-lb flex flex_ac flex_jsb\"><span>What is a BIST?<\/span><\/h3>\r\n              <p class=\"pdg-b70 font-sp14\">BIST (Built-in Self Test) is one of the DFT technologies.<br>This is a method in which some of the functions originally provided by a tester are incorporated into the IC's circuitry, and the IC itself performs a self-test.<br>BIST circuitry includes functions such as generating test patterns to be applied to the circuit under test, compressing output patterns from the test object, and comparing the compressed patterns with expected values.<br>The functions required for the tester are limited, and many ICs can be tested at the same time, so test costs can be reduced.<br>BIST circuits include memory BIST for memory testing and logic BIST for logic circuit testing.<\/p>\r\n\r\n              <h3 class=\"title--border-lb flex flex_ac flex_jsb\"><span>What is a SCAN test?<\/span><\/h3>\r\n              <p class=\"pdg-b70 font-sp14\">Scan testing is also DFT technique that is one of the methods for testing logic circuits.<br>It is one of the structural inspections used to detect faults in a mode in which the logic value is always 1 or 0 due to the opening or shorting of circuits inside the IC. During the scan test, a chain of FF (flip-flops) called a scan chain for testing is configured inside the IC. The test pattern data from the tester is sent to the circuit block under test via the FF chain, and the response reflecting the internal state of the test target is retrieved via the FF chain.<br>By comparing it with the pre-assumed response pattern, internal fault points can be detected.<br>By assuming a failure model in advance and automatically generating a pattern that makes it easier to identify defects from circuit design data, it is possible to perform tests with a high failure detection rate in a short time even for large-scale ICs.<\/p>\r\n            <\/div>\r\n          <\/div>\r\n        <\/div>\r\n\r\n      <\/section>\r\n\r\n      <section class=\"common-contact common-contact--en\">\n  <div class=\"inner flex_pc flex_ac show lazy\">\n    <h2 class=\"common-contact__title\">Contact Us<\/h2>\n    <p class=\"common-contact__text font-sp14\">Contact us for any support or queries you may have about our products.<\/p>\n    <p class=\"common-contact__link\"><a 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